128. L.M. Goldman, H.A. Atwater and F. Spaepen, "A systematic method for extracting structural parameters from low angle x-ray reflectivity measurements on multilayers," Materials Research Society Symposia Proceedings (Pittsburgh, PA: Materials Research Society, 1990) 160:577-581. [B8,H]
115. B. Park, F. Spaepen, J.M. Poate, D.C. Jacobson and F. Priolo, "X-ray measurements of ion mixing in amorphous Si/Ge artificial multilayers," Journal of Applied Physics, 68:4556-4560 (1990). [C19]
106. E. Chason and F. Spaepen, "Pressure-induced structural changes in boron oxide glass," Journal of Applied Physics 64:4435-4449 (1988). [C18]
85. E. Chason, H. Kondo, T. Mizoguchi, R.C. Cammarata, F. Spaepen, B. Window, J.B. Dunlop and R.K. Day, "Amorphous Cu-Zr and Fe-Ti compositionally modulated films produced by sputtering from elemental targets," Materials Research Society Symposia Proceedings (Pittsburgh, PA: Materials Research Society, 1986) 58:69-74. [B7,B8]
75. T.W. Wu and F. Spaepen, "Small angle x-ray scattering from an embrittling metallic glass," Acta Metallurgica 33:2185-2190 (1985). [B8,C18]
72. E. Chason, A.L. Greer, K.F. Kelton, P.S. Pershan, L.B. Sorenson, F. Spaepen and A.H. Weiss, "Structural relaxation of amorphous Pd 82 Si 18 : X-ray measurements, electrical resistivity measurements and a comparison via the Ziman theory," Physical Review B 32:3399-3408 (1985). [B6,C17]
68. A.L. Greer and F. Spaepen, "Diffusion," Synthetic Modulated Structure (New York: Academic Press, 1985), pp. 419-486. [B6,C15]