257. J.A. Kalb, M. Wuttig and F. Spaepen, "Calorimetric measurements of structural relaxation and glass transition temperatures in sputtered films of amorphous Te alloys used for phase change recording", to appear in the Journal of Materials Research.
250. J. Kalb, F. Spaepen and M. Wuttig, "Kinetics of crystal nucleation in undercooled droplets of Sb and Te based alloys used for phase change recording", Journal of Applied Physics: 98, 054910 1-7 (2005).
249. J. Kalb, C.Y. Wen, F. Spaepen, H. Dieker and M. Wuttig, "Crystal morphology and nucleation in thin films of amorphous Te alloys used for phase change recording", Journal of Applied Physics: 98, 054902 1-6 (2005).
245. R. Detemple, H. Dieker, J. Kalb, M. Luo, F. Spaepen, C. Steimer, D. Wamwangi, H.W. Wöltgens, M. Wuttig and S. Ziegler, "Phase change materials: from crystal structures to kinetics", to appear in the Proceedings of the European Symposium on Phase Change Materials and Ovonics, 2004.
241. J. Kalb, F. Spaepen and M. Wuttig, "Atomic force microscopy measurements of crystal nucleation and growth rates in thin films of amorphous Te alloys", Applied Physics Letters 84:5240-5242 (2004).
237. J. Kalb, F. Spaepen and M. Wuttig, "Kinetics of crystal nucleation and growth in thin films of amorphous Te alloys measured by atomic force microscopy", Materials Research Society Symposia Procceedings (Pittsburgh, PA: Materials Research Society, 2004) 803:HH3.8.1-6.
234. J. Kalb, F. Spaepen and M. Wuttig, "Calorimetric measurements of phase transformations in thin films of amorphous Te alloys used for optical data storage", Journal of Applied Physics, 93:2389-2393 (2003).
228. T. Pedersen, J. Kalb, W. Nojoroge, D. Wamwangi, M. Wuttig and F. Spaepen, "Mechanical stresses upon crystallization in phase change materials"; Applied Physics Letters, 79:3597-3599 (2001).
221. P.G. Evans, O.D. Dubon, J.F. Chervinsky, M.J. Aziz, F. Spaepen and J.A. Golovchenko, M.F. Chisholm, and D.A. Muller "Doping by metal-mediated epitaxy: growth of As delta-doped Si through a Pb monolayer", Applied Physics Letters, 78:1505 (2001)